The X-ray standing wave (XSW) technique is a method particularly suitable for studying organic thin films in the monolayer regime. It provides element specific structural information of adsorbed molecules and their complex interaction with the substrate.
Due to photoexcitation processes within the adlayer electrons and fluorescence light are emitted. The variation of the photoelectron (fluorescence) yield when scanning through the Bragg condition - by changing the photon energy or incidence angle - depends on the adsorbate position, see this simulation. |
Therefore element specfic atomic positions of adsorbates on crystalline substrates can be extracted. Further
details can be found in this more quantitative introduction
to the XSW technique.
As adsorbate studies require clean surfaces, the substrates are held under ultra-high vacuum conditions.
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For our work using the XSW technique see also this ESRF Spotlight on Science, the ESRF Highlights 2008, the ESRF Highlights 2011, and our list of publications.
Recomended review articles on the XSW technique:
[1] J. Zegenhagen. Surf. Sci. Rep. 18(7/8) (1993) 199
[2] D. P. Woodruff, Rep. Prog. Phys. 68(4) (2005) 743
[3] M. J. Bedzyk and L. Cheng, Rev. Mineral. Geochem. 49 (2002) 221
[4] A. Franco-Cañellas, S. Duhm, A. Gerlach, and F. Schreiber, Rep. Prog. Phys. 83 (2020) 066501