Grazing incidence wide-angle X-ray scattering (GIWAXS) is a powerful technique for the investigation of crystalline thin films. The reciprocal space intensity maps obtained reveal important structural chracteristics of the investigated samples such as the lattice constants of the constituent crystals, their orientational distribution and the crystal grain sizes. A relevant application of GIWAXS is studying the complex crystallization process of perovskite materials, which is important for optimizing their optoelectronic properties for photovoltaic applications. Such measurements are typically performed in real time, at high aqusition rates and for extended time periods. This process results in large amounts of data (thousands of high resolution 2D GIWAXS images) being collected at each experiment, surpassing the capacity of researchers to manually process and analyse the data. This motivates the need for an automated analysis pipeline for GIWAXS data to be developed. |
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'gixi' is a freely available Python package using artificial neural networks that was developed in our group and can be used for GIXD feature detection.
[1] V. Starostin, V. Munteanu, A. Greco, E. Kneschaurek, A. Pleli, F. Bertram, A. Gerlach,
A. Hinderhofer, F. Schreiber. Tracking perovskite crystallization via deep learning-based feature
detection on 2D X-ray scattering data. npj Comput Mater 8 (2022) 101
[2] A. Hinderhofer, A. Greco, V. Starostin, V. Munteanu, L. Pithan, A. Gerlach, and F. Schreiber. Machine learning
for scattering data: strategies, perspectives, and applications to surface scattering. J. Appl. Cryst. 56
(2023) 3
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